 Connection
Michael Toney to Materials Testing
This is a "connection" page, showing publications Michael Toney has written about Materials Testing.
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Connection Strength |
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0.150 |
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Misra S, Liu N, Nelson J, Hong SS, Cui Y, Toney MF. In situ X-ray diffraction studies of (de)lithiation mechanism in silicon nanowire anodes. ACS Nano. 2012 Jun 26; 6(6):5465-73.
Score: 0.089
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Miller NC, Cho E, Junk MJ, Gysel R, Risko C, Kim D, Sweetnam S, Miller CE, Richter LJ, Kline RJ, Heeney M, McCulloch I, Amassian A, Acevedo-Feliz D, Knox C, Hansen MR, Dudenko D, Chmelka BF, Toney MF, Br?das JL, McGehee MD. Use of X-ray diffraction, molecular simulations, and spectroscopy to determine the molecular packing in a polymer-fullerene bimolecular crystal. Adv Mater. 2012 Nov 27; 24(45):6071-9.
Score: 0.023
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Baker JL, Widmer-Cooper A, Toney MF, Geissler PL, Alivisatos AP. Device-scale perpendicular alignment of colloidal nanorods. Nano Lett. 2010 Jan; 10(1):195-201.
Score: 0.019
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Cates NC, Gysel R, Beiley Z, Miller CE, Toney MF, Heeney M, McCulloch I, McGehee MD. Tuning the properties of polymer bulk heterojunction solar cells by adjusting fullerene size to control intercalation. Nano Lett. 2009 Dec; 9(12):4153-7.
Score: 0.019
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Connection Strength
The connection strength for concepts is the sum of the scores for each matching publication.
Publication scores are based on many factors, including how long ago they were written and whether the person is a first or senior author.
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