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Connection

Mary Sammel to Intrauterine Device Migration

This is a "connection" page, showing publications Mary Sammel has written about Intrauterine Device Migration.

 
Connection Strength
 
 
 
0.154
 
  1. Gurney EP, Sonalkar S, McAllister A, Sammel MD, Schreiber CA. Six-month expulsion of postplacental copper intrauterine devices placed after vaginal delivery. Am J Obstet Gynecol. 2018 08; 219(2):183.e1-183.e9.
    View in: PubMed
    Score: 0.154
Connection Strength

The connection strength for concepts is the sum of the scores for each matching publication.

Publication scores are based on many factors, including how long ago they were written and whether the person is a first or senior author.

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