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Microscopy, Atomic Force

"Microscopy, Atomic Force" is a descriptor in the National Library of Medicine's controlled vocabulary thesaurus, MeSH (Medical Subject Headings). Descriptors are arranged in a hierarchical structure, which enables searching at various levels of specificity.

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A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.


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This graph shows the total number of publications written about "Microscopy, Atomic Force" by people in this website by year, and whether "Microscopy, Atomic Force" was a major or minor topic of these publications.
Bar chart showing 80 publications over 17 distinct years, with a maximum of 9 publications in 2009 and 2013
To see the data from this visualization as text, click here.

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