Transport-of-intensity-based phase imaging to quantify the refractive index response of 3D direct-write lithography.
Glugla DJ, Chosy MB, Alim MD, Sullivan AC, McLeod RR. Transport-of-intensity-based phase imaging to quantify the refractive index response of 3D direct-write lithography. Opt Express. 2018 Jan 22; 26(2):1851-1869.